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Conductance peaks produced by kondo scattering from O2 in M-I-M tunnel junctions
Authors:Stuart Bermon  C.K. So
Affiliation:Department of Physics, City College of the City University of New York New York, New York 10031, USA
Abstract:Peaks centered about zero-bias in the dynamic conductance of Al-I-Au tunnel junctions condensed onto liquid-helium-cooled substrates are shown to be due to Kondo scattering from paramagnetic molecular oxygen trapped at the metal-insulator interface by studying the concentration dependence of the peaks in junctions intentionally doped with O2.
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