On the Auger inverse sensitivity factors of In and Sb in InSb |
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| Authors: | F.D. Auret |
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| Affiliation: | Physics Department, University of Port Elizabeth, P.O. Box 1600, Port Elizabeth 6000, South Africa |
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| Abstract: | The Auger inverse sensitivity factors αi for In and Sb on a (111) In surface of an InSb crystal mounted on a 30° sample holder were determined as 0.56 ± 0.04 and 0.67 ± 0.05, respectively, by Auger Electron Spectroscopy (AES). These values were referenced to the clean Si 92 eV peak and differ significantly from those obtained for In and Sb when in their elemental form. Angular dependent variations in the αi values were observed upon rotation of the sample about its normal. |
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