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Energy losses of fast electrons in multi-layer systems
Authors:H. Richter  J. Geiger
Affiliation:(1) Fachbereich Physik, Universität Kaiserslautern, Pfaffenbergstraße, Geb. 46, Postfach 3049, D-6750 Kaiserslautern, Federal Republic of Germany;(2) Present address: Max-Planck-Institut für Festkörperforschung, D-7000 Stuttgart 80, FRG
Abstract:Starting from Maxwell's equations a formula for the energy loss probability of fast electrons in systems of a given number of thin layers is derived for normal incidence. Retardation effects are neglected. For three layers of arbitrary thickness the equations are fully solved. As examples, a two-metallic-layer system with energy-dependent dielectric functions is discussed. Furthermore, the tarnish of metals e.g. Al–Al2O3, Be–BeO, Ag–Ag2S is considered as three-layer systems. The energy loss spectrum of the system Al2O3–Al–Al2O3 is calculated in agreement with the experiment. It turns out that the bulk longitudinal optical mode of the covering layer is excited in the infra-red. In the case of the oxidation of a dielectric film the transversal mode of the oxide is expected to prevail in the energy loss spectrum.
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