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Effect of annealing temperature on microstructure of chemically deposited calcium modified lead titanate thin films |
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| Authors: | Sonalee Chopra Seema Sharma T. C. Goel R. G. Mendiratta |
| Affiliation: | a Advanced Ceramics Laboratory, Department of Physics, Indian Institute of Technology, New Delhi 110016, India b BITS-PILANI-GOA Campus, Zuari Nagar, Goa, India c Netaji Subhas Institute of Technology, Dwarka, New Delhi 110045, India |
| Abstract: | Thin ferroelectric films of calcium modified lead titanate Pb1−xCaxTiO3(PCT) have been prepared by chemical deposition process. The as deposited amorphous films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various amounts of calcium (Ca)-doping (0.20, 0.24, and 0.28) on indium tin oxide (ITO) coated corning glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out at various annealing temperatures (450, 550, and 650 °C). Characterization of these films by XRD shows that the films exhibit tetragonal phase with perovskite structure. Atomic force microscope images (AFM) are characterized by slight surface roughness with a uniform crack-free, densely-packed structure. Also, Fourier transform infrared spectra (FT-IR) of the as deposited film and annealed thin films (x=0.24) at 650 °C on silicon (Si) substrates were taken to get more information about the film formation. Dielectric studies of the films were carried out and reported. |
| Keywords: | PCT films Sol–gel Microstructure AFM FT-IR |
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