Glassy dynamics in nanometer thin layers of polystyrene |
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Authors: | EU Mapesa M Erber M Tress K-J Eichhorn A Serghei B Voit and F Kremer |
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Institution: | 1.Institute for Experimental Physics I, Leipzig University,Leipzig,Germany;2.Leibniz Institute of Polymer Research,Dresden,Germany;3.University of Massachusets Amherst,Amherst MA,USA |
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Abstract: | Broadband Dielectric Spectroscopy (BDS) and Ellipsometry are combined to study the glassy dynamics of nanometric layers (≥
5 nm) of polystyrene. For the former, two types of sample arrangement are applied, that is, the conventional method where
evaporated metal electrodes are used and a novel technique in which insulating silica nanostructures serve as spacers between
highly conducting doped silicon counter electrodes. Within the limits of the experimental accuracy (± 2 K) both approaches,
BDS and Ellipsometry, deliver the coinciding result that – compared to the bulk – the glassy dynamics is not shifted. Furthermore the dielectric measurements do not indicate any broadening of the relaxation time distribution function, independent of the sample geometry employed. |
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