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Impact of substrate injected hot electrons on hot carrier degradation in a 180-nm NMOSFET |
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| Authors: | Liang Bin Chen Jian-Jun and Chi Ya-Qing |
| Affiliation: | School of Computer Science, National University of Defense Technology, Changsha 410073, China |
| Abstract: | substrate hot electron injection, hot carrier injection （HCI） degradation, interface trap, oxidetrapped charge |
| Keywords: | substrate hot electron injection hot carrier injection （HCI） degradation interface trap oxidetrapped charge |
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