Evidence for electron‐based ion generation in radio‐frequency ionization

Radio‐frequency ionization (RFI) is a novel ionization method coupled to mass spectrometry (MS) for analysis of semi‐volatile and volatile organic compounds (VOCs). Despite the demonstrated capabilities of RFI MS for VOC analysis in both positive‐ and negative‐ion modes, mechanism of RFI is not completely understood. Improved understanding of the ion generation process in RFI should expand its utility in MS. Here, we studied the possibility of electron emission in RFI using both direct charged particle current measurements and indirect electron detection in a 9.4‐T Fourier transform‐ion cyclotron resonance (FT‐ICR) mass spectrometer. We show that RF‐generated electrons can be trapped in the ICR cell and, subsequently, reacted with neutral hexafluorobenzene (C₆F₆) molecules to generate C₆F₆^●?. Intensity of observed C₆F₆^●? species correlated with the number of trapped electrons and decreased as a function of electron quenching period. We also measured the electron attachment rate constant of hexafluorobenzene using a post‐RF electron trapping experiment. Measured electron attachment rate constant of hexafluorobenzene (1.19 (±0.53) × 10^?9 cm³ molecule^?1 s^?1) for post‐RF FT‐ICR MS agreed with the previously reported value (1.60 (±0.30) × 10^?9 cm³ molecule^?1 s^?1) from low‐pressure ICR MS measurements. Experimental results from direct and indirect electron measurements suggest that RFI process involves RF‐generated electrons under ultrahigh vacuum conditions. Copyright © 2015 John Wiley & Sons, Ltd.