Surface enhanced Raman with anodized aluminum oxide films |
| |
Authors: | Zhang C Abdijalilov K Grebel H |
| |
Affiliation: | Electronic Imaging Center at NJIT, Newark, New Jersey 07102, USA. |
| |
Abstract: | Aluminum is not a platform of choice for surface enhanced Raman scattering (SERS) experiments despite its large negative permittivity value (larger than gold or silver at optical wavelengths). It is also widely believed that an oxide layer on top of any platform substantially impedes SERS signals. Yet, anodized aluminum oxide may be perforated in an organized fashion and we have used it to examine SERS of single walled carbon nanotubes (SWCNTs) at micron length and fullerene (C60) at the nanoscale. The signal-to-noise ratio of the corresponding Raman signals exhibited a large signal enhancement for SWCNTs but not for C60. We attributed the SERS to the formation of standing surface charge waves in this subwavelength environment. |
| |
Keywords: | |
本文献已被 PubMed 等数据库收录! |
|