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Residual Intensity as a Morphological Identifier of Twinning Fields in Microscopic Image Correlation
Authors:Özdür  N. A.  Üçel  İ. B.  Yang  J.  Aydıner  C. C.
Affiliation:1.Department of Mechanical Engineering, Bogazici University, 34342, Istanbul, Bebek, Turkey
;3.Department of Mechanical Engineering, University of Wisconsin-Madison, 1513 University Ave B1180, Madison, WI, 53713, USA
;
Abstract:Experimental Mechanics - In the microscopic observation of deforming metals, it is well known that crystallite defects that accommodate strain can occasionally become visible, namely, they...
Keywords:
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