Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples |
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| Authors: | Chris M Sparks Ursula EA Fittschen George J Havrilla |
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| Institution: | 1. Analytical Services, SVTC Technologies, Austin, TX 78741, United States;2. Chemistry Division, Los Alamos National Laboratory, Los Alamos, NM 87545, United States;3. Institute of Inorganic and Applied Chemistry, University of Hamburg, 20146 Hamburg, Germany |
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| Abstract: | A deposition system capable of delivering picoliter quantities of solution in programmable arrays was investigated as a method for sample preparation for total reflection X-ray fluorescence (TXRF) spectroscopy. Arrays of trace metals in solution were deposited on Si wafers. The array deposits provide a capability of depositing closely spaced (100 μm or less), typically 5–20 μm diameter droplets in an area that can be matched to the analysis spot of the TXRF detector. The dried depositions were physically characterized and the effect of deposition type and matrix on the TXRF signal was investigated. |
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