Effects of pattern dependence on high-power polarization-division-multiplexing applications |
| |
| Authors: | Anlin Yi Lianshan Yan Bin Luo Wei Pan Jia Ye |
| |
| Affiliation: | Center for Information Photonics and Communications, School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China |
| |
| Abstract: | High-power polarization-division-multiplexing (PDM) systems or functional modules, such as self-phase-modulation (SPM)-based all-optical regenerators, cross-phase-modulation (XPM)-based wavelength convertors or format convertors, all-optical logical gate, and so on, may suffer from the effects of pattern dependence. Such effects are experimentally investigated using relative time delay variation between bit sequences with orthogonal polarization states in a 2 × 10.65 Gb/s high-power on-off keying (OOK) PDM system. Eye-diagram-based signal-to-noise ratio (SNR) and bandwidth of broadened spectrum are measured and compared. An eye-diagram-based SNR fluctuation of up to 4 dB may occur as the delay changes. |
| |
| Keywords: | |
| 本文献已被 CNKI 维普 等数据库收录！ |
|
