首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Polyaniline/gallium doped ZnO heterostructure device via plasma enhanced polymerization technique: Preparation, characterization and electrical properties
Authors:Sadia Ameen  M Shaheer Akhtar  Young Soon Kim  O-Bong Yang  Hyung-Shik Shin
Institution:1. Energy Materials & Surface Science Laboratory, Solar Energy Research Center, School of Chemical Engineering, Chonbuk National University, Jeonju, 561-756, Republic of Korea
2. School of Semiconductor and Chemical Engineering & Solar Energy Research Center, Chonbuk National University, Jeonju, 561-756, Republic of Korea
3. New & Renewable Energy Material Development Center (NewREC), Chonbuk National University, Buan-gun, Jeonbuk, Republic of Korea
Abstract:The ZnO and gallium-doped ZnO nanoparticles (NPs) were synthesized by simple chemical method and used for the fabrication of p-polyaniline/n-ZnO heterostructures devices in which polyaniline was deposited by plasma-enhanced polymerization. The increment in the crystallite sizes of gallium doped ZnO nanoparticles from ~21.85 nm to ~32.39 nm indicated the incorporation of gallium ion into the ZnO nanoparticles. The surface and structural studies investigated the participation of protonated N atom for the bond formation between polyaniline and gallium-ZnO through partial hydrogen bonding. Compared to a Pt/polyaniline/ZnO diode, the fabricated Pt/polyaniline/gallium-ZnO heterostructure diode exhibited good rectifying behavior with Current–Voltage characteristics of improved saturation current, low ideality factor, and a high barrier height might due to the efficient charge conduction via gallium ion at the junction of the polyaniline/gallium doped-ZnO interface.
Figure
(a) Schematic illustration and (b) I-V characteristics of Pt/PANI/Ga-ZnO heterostructure device. The heterostructure device is obtained by a top Pt layer on PECVD deposited PANI/Ga-ZnO electrodes. The fabricated Pt/PANI/Ga-ZnO heterostructure device displays non-linear and rectifying behavior of I–V curve due to the existence of Schottky barrier via a Schottky contact at the interfaces of Pt layer and PANI/Ga-ZnO thin film layer.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号