| Abstract: | A novel method for investigating the morphology of multiphase polymers is discussed. In this procedure, inherent differences in secondary and backscattered electron emission from the various components rather than topographical variations are used to produce image contrast. The combined use of various selective stains and energy-dispersive x-ray analysis to accentuate and positively identify individual phases is discussed. The effects of coating thickness and type and changes in accelerating voltage on image quality are also described. |
