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Degradation of organic light-emitting diodes based on different-ligand complexes of terbium (III) salicylate and 2-phenoxybenzoate
Authors:L. S. Lepnev  A. A. Vashchenko  A. G. Vitukhnovskii  S. V. Eliseeva  O. V. Kotova  N. P. Kuzmina
Affiliation:(1) Physico-Technical Institute, Institutsky per. 9, Dolgoprudnyi, Moscow Oblast, 141700, Russia;(2) Lomonosov State University, Vorobievy Gory, Moscow, 119899, Russia
Abstract:Degradation (D) of organic light-emitting diodes (OLEDs) based on new different-ligand complexes of terbium salicylate (Tb(Sal)3(TPPO)2) and 2-phenoxybenzoate (Tb(pobz)3(TPPO)2) with triphenyl phosphinoxide (TPPO) was studied. Initial reversible D is associated with charge carrier trap filling. A temperature increase, applied stress relief, and short-term irradiation with UV light lead to trapped charge carrier release and electroluminescence (EL) intensity recovery. During strong heating, irreversible D is observed after the recovery; this D requires in addition an electric field (EF). Intense UV light causes D without EF. The use of ac bias voltage eliminates reversible D, and sealing retards irreversible long-term D.
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