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用于非球面测试的位相型计算全息图制作
引用本文:马杰,朱效立,谢常青,叶甜春,赵珉,刘明,陈宝钦,朱日宏,高志山,马骏. 用于非球面测试的位相型计算全息图制作[J]. 微细加工技术, 2008, 0(6)
作者姓名:马杰  朱效立  谢常青  叶甜春  赵珉  刘明  陈宝钦  朱日宏  高志山  马骏
作者单位:1. 中国科学院微电子研究所,北京,100029
2. 南京理工大学光学工程系,南京,210094
基金项目:国家重点基础研究发展规划(973计划),中国高技术发展研究计划 
摘    要:本文对计算全息图元件的设计和制作成算法和软件,研究了采用高速电子束直写系统制作大面积、非周期性复杂光刻图形技术,在此工作的基础上,采用湿法腐蚀铬、感应耦合等离子体刻蚀石英玻璃两步图形转移的方案,制作出了图形区直径为64 mm、最外环线条宽度为2.0μm、刻蚀深度为690 nm的位相型计算全息图元件,并对加工结果进行了测量.结果表明,本方案所制作的计算全息图元件具有良好的加工质量,符合应用的需求.

关 键 词:非球面测试  计算全息图  电子束光刻  湿法腐蚀  感应耦合等离子体刻蚀

Fabrication of Phase-type Computer-generated Holograms for Aspheric Surface Test
MA Jie,ZHU Xiao-li,XIE Chang-qing,YE Tian-chun,ZHAO Min,LIU Ming,CHEN Bao-qin,ZHU Ri-hong,GAO Zhi-shan,MA Jun. Fabrication of Phase-type Computer-generated Holograms for Aspheric Surface Test[J]. Microfabrication Technology, 2008, 0(6)
Authors:MA Jie  ZHU Xiao-li  XIE Chang-qing  YE Tian-chun  ZHAO Min  LIU Ming  CHEN Bao-qin  ZHU Ri-hong  GAO Zhi-shan  MA Jun
Affiliation:MA Jie1,ZHU Xiao-li1,XIE Chang-qing1,YE Tian-chun1,ZHAO Min1,LIU Ming1,CHEN Bao-qin1,ZHU Ri-hong2,GAO Zhi-shan2,MA Jun2(1.Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China,2.Department of Optical Engineering,Nanjing University of Science , Technology,Nanjing 210094,China)
Abstract:The design principle of computer-generated-holograms(CGHs) was introduced and the key fabrication technique was studied.Algorithms and software for the generation of CGH lithography patterns were developed independently and the technique for fabricating large-area,nonperiodical,complex lithography patterns employing high-speed electron beam lithography system was studied.With additional processes of wet etching of chrome and ICP etching of fused silica,the phase-type CGH with a diameter of 64 mm,an outermos...
Keywords:aspheric surface test  computer-generated hologram  electron-beam lithography  wet etching  inductively coupled plasma etching  
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