Thin oxide films on germanium

The optical constants, i.e. the refractive index and thickness, were determined for thin oxide films which were produced by heating single-crystal samples of germanium to temperatures ranging from 450° C to 600° C. The ellipsometric method was used to determine the thicknesses and the refractive indices of the films.The paper is dedicated to the memory of Dr. A. Vaíek, Professor of the J. E. Purkyn University in Brno, who died on Nevember 16, 1966.