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Angular dependence of exchange bias and coercivity in polycrystalline CoFe/MnIr bilayers |
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| Authors: | Dong Young Kim CheolGi Kim Chong-Oh Kim M Tsunoda M Takahashi |
| Institution: | 1. ReCAMM, Chungnam National University, 220, Yusung-Ku, Daejeon, 305-764, Korea;2. Department of Electronic Engineering, Graduate School of Engineering, Tohoku University, Aoba-yama 05, Sendai 980-8579, Japan;3. New Industry Creation Hatchery Center, Tohoku University, Aoba-yama 10, Sendai 980-8579, Japan |
| Abstract: | |
| Keywords: | 75 70 Cn 75 30 Et 75 50 Ee |
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