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Thickness dependence of crystallographic and magnetic properties for L10-CoPt thin films
Authors:W.M. Liao  S.K. Chen  F.T. Yuan  C.W. Hsu  H.Y. Lee
Affiliation:1. Department of Materials Science and Engineering, Feng Chia University, Taichung, Taiwan, ROC;2. National Synchrotron Radiation Research Center, Hsinchu, Taiwan, ROC
Abstract:
Keywords:75.75.Vv   75.70.&minus  i   75.70.Ak
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