Vacancy defects in as-grown and nº-irradiated GaP and GaAs1−xPx Studied by Positrons

Measurements of positron lifetime τ and of the shape parameter S of the Doppler-broadened annihilation line are used to study bulk and defect properties in GaP and GaAs_1−xP_x. τ and S decrease linearly with the composition x of GaAs_1−xP_x layers. A second lifetime component (τ₂ = 290 ps) observed in as-grown GaP is attributed to stoichiometric P vacancies. After neutron irradiation of GaP and GaAs_0.13P_0.87 positrons are trapped by Ga vacancies (τ₂ = 250 ps). These vacancies anneal out in two stages at 200–550 °C and 550–800 °C.