用于静态和动态平面内位移测量的剪切束电子斑纹图干涉术的相移和载波技术

报道了一种新颖的用于平面内位移测量的相移和载波技术。在剪切束电子斑纹图干涉度量术中，照明光束由棱镜分为两个波前，棱镜的侧面移动将引入相移。在棱镜后加一小角光楔，则光楔的转动产生载波条纹。棱镜或光楔的转动可由机械或电学机构精密控制。形变信息由数字图像处理算法，相位迭代和傅里叶变换法给出。文中介绍了理论及其实验演示的结果

Phase Shift and Carrier Techniques of Shear Beam ESPI for Static and Dynamic In-Plane Displancement Measurement

Novel phase shift and carrier techniques for measurement of in-place displacement field are proposed. In shear beam ESPI (Electronic Speckle Interferometry) the illumination beam is split into two wave fronts by a prism. Laterally movements of the prism introduce phase shifts. A small angle wedge is set behind the prism. A rotation of the wedge produces carrier fringes. The movement of the prism or the wedge can be controlled precisely be mechanical or electrical mechanism. digital image processing algorithms, phase iteration and FTM (Fourier Transform Method), are used to extract defoemation information. Theores and thier experimental demonstrations are presented.