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Dielectric properties of Ta2O5 films grown on silicon substrates plasma nitrided in N2O
Authors:N. Novkovski  E. Atanassova
Affiliation:(1) Institute of Physics, Faculty of Natural Sciences and Mathematics, Gazibaba b.b., 1000 Skopje, Macedonia;(2) Institute of Solid State Physics, Bulgarian Academy of Sciences, 72 Tzarigradsko Chaussee blvd., 1784 Sofia, Bulgaria
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