EXAFS and XANES Studies of Silica-Titania Sol-Gel Films |
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Authors: | RM Almeida MI de Barros Marques Xavier Orignac |
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Institution: | (1) Departamento de Engenharia de Materiais/INESC, I.S.T., Av. Rovisco Pais, 1000 Lisboa, Portugal;(2) Centro de Física da Matéria Condensada, U.L., 2 Av. Prof. Gama Pinto, 1699 Lisboa Codex, Portugal |
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Abstract: | A series of SiO2-TiO2 sol-gel films with and without heat treatment were analyzed by EXAFS and XANES spectroscopies. Both techniques indicate that essentially all Ti4+ ions remain four-fold coordinated, with a Ti–O bond distance between 1.82–1.85 Å. In the glassy films produced by heat treatment at 900° C, a gradual phase separation may occur at the nanoscale, as the TiO2 concentration of the films increases. |
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Keywords: | SiO2− TiO2 films EXAFS XANES synchrotron radiation four-fold coordinated Ti structure of sol-gel films |
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