Features in phase-contrast images of micropipes in SiC in white synchrotron radiation beam |
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Authors: | V G Kohn T S Argunova Jung Ho Je |
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Institution: | 1.Russian Research Center “Kurchatov Institute”,Moscow,Russia;2.Ioffe Physical Technical Institute,Russian Academy of Sciences,St. Petersburg,Russia;3.Pohang University of Science and Technology,Nam-gu Pohang,Republic of Korea |
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Abstract: | An interesting feature in phase-contrast images of micropipes in silicon carbide in white synchrotron radiation beam was experimentally
studied and theoretically explained. This feature consists in that a change in micropipe cross-section sizes does not lead
to changes in its image sizes, but has an effect only on the contrast. The experiment was performed on the synchrotron radiation
source in Pohang, South Korea. On the one hand, this effect is explained by a small phase progression caused by the micropipe,
and, on the other hand, by satisfying the conditions for Fraunhofer diffraction, when the transverse micropipe size is smaller
than the first Fresnel zone diameter. As a rule, the near-field conditions are satisfied in X-ray optics when only object
edges are imaged. However, micropipes are so small that the standard edge theory is inapplicable. A universal intensity distribution
profile was obtained for micropipes with very small cross sections. |
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