磁光盘原始误码特性测试中的等效性问题分析

在磁光盘原始误码特性测试过程中通常采用记“1”测漏码,或记“0”测冒码的方法测试盘片的误码性能。本文侧重分析了介质膜缺陷导致盘片产生误码的原因,建立了读出畸变信号与介质膜缺陷参量(如大小、位置、缺陷因子等)的数学模型。分析表明,在盘面记“1”和记“0”两种情况下,同一介质膜缺陷产生的信号畸变幅值相等,从而从理论上证明了记“1”测漏码与记“0”测冒码具有一定等效性。

ANALYSIS OF THE TESTING EQUIVALENCE OF BIT ERROR CHAKACTEKlSTICS FOR MAGNETO-OPTICAL DISKS

Testing the drop code with data“1”recorded and testing the burst code with“0”recorded arethe common methods to investigate the bit error characteristics of magneto-optical disks,This papergives an analysis of the causes of media defects to produce bit errors for magneto-optical disks,andlays emphasis on modeling the relationships between distortion signals and defect parameters(such assize,position and defect factor).It is shown that the same defect results in the same change in thereadout signal,while data of one and zero recorded respectively.As a result,it is proved theoreticallythat testing the drop code with“1”recorded and testing the burst code with“ 0”recorded is equivalent in same way.