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Multielement analysis of standard reference materials with total reflection X-ray fluorescence (TXRF)
Authors:W Gerwinski and D Goetz
Institution:(1) Ordinariat für Bodenkunde, Universität Hamburg, Allende-Platz 2, D-2000 Hamburg 13, Federal Republic of Germany
Abstract:Summary X-Ray fluorescence analysis with total-reflected exciting beam (TRXF) represents a comparatively new development among the multielement methods. The main application of this method is the analysis of liquid samples. Furthermore, the measurements of suspensions and dust samples are practicable. With regard to sample preparation, execution and results information in various applications is at present available. This report gives a survey of advantages and restrictions of TXRF in soil science. After the digestion of various reference materials in two different ways, measurements were performed by TXRF. The elements Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Rb, Sr, Ba and Pb were taken into consideration.
Multielement-Analyse von Standard-Referenzmaterialien mit der Totalreflexions-Röntgenfluorescenz (TRFA)
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