The effect of statistical noise on structural parameters in EXAFS data analysis |
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Authors: | L Incoccia S Mobilio |
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Institution: | (1) Laboratori Nazionali di Frascati, PULS, Frascati, Italia |
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Abstract: | Summary We analyse the effect of the statistical noise on the physical parameters derived from an EXAFS spectrum. Two separate classes
of experimental cases are discussed, namely heavy and light backscatterers. The weight of the noise in the two cases is, in
fact, quite different, depending on thek range useful for the analysis of the data. We find that for heavy backscatterers the statistical noise can usually be neglected,
while for light backscatterers it can be one of the main limitations in obtaining reliable results from EXAFS.
Paper presented at the Workshop on ?EXAFS Data Analysis in Disordered Systems?, held in Parma, October 5–7, 1981. |
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Keywords: | X-ray determination of structures |
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