| 化学力显微镜针尖修饰技术研究新进展 |
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| 引用本文： | 彭章泉,唐智勇,汪尔康. 化学力显微镜针尖修饰技术研究新进展[J]. 分析化学, 2000, 28(5): 644-648 |
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| 作者姓名： | 彭章泉 唐智勇 汪尔康 |
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| 作者单位： | 中国科学院长春应用化学研究所电分析化学开放研究实验室,国家电化学和光谱研究分析中心,长春,130022 |
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| 摘 要： | 评述了化学力显微镜的新成果。对自组装单分子膜修饰扫描探针显微镜针尖，生物分子修饰原子力显微镜针尖，电化学方法修饰扫描隧道显微镜针尖，纳米碳管材料修饰原子力显微镜针尖等作了介绍。
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| 关 键 词： | 化学力显微镜 扫描探针显微镜 针法修饰技术 |
Recent Development of Tip Modification Techniques in Chemical Force Microscope |
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| Peng Zhangquan,Tang Zhiyong,Wang Erkang. Recent Development of Tip Modification Techniques in Chemical Force Microscope[J]. Chinese Journal of Analytical Chemistry, 2000, 28(5): 644-648 |
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| Authors: | Peng Zhangquan Tang Zhiyong Wang Erkang |
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| Abstract: | A review is given on the recent development of scanning probe microscope (SPM) tip modification techniques for chemical force microscope, including the preparation and application of SPM tip modified by self-assembled menolayer, atomic force microscope (AFM) tip modified by biological moelecule, scanning tunneling microscope tip modified by electrochemical method, AFM tip modified by carbon nanotube. |
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| Keywords: | Chemical force microscope scanning probe microscope atomic force microscope scanning tunneling microscope self-assembled monolayer review |
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