X-ray diffraction study of crystals under a static electric field

This paper gives an overview of the effect of electric field on the diffracted intensity and contrast on the X-ray topographs recorded from crystals of non-linear and electro-optic materials, ionic conductors, semiconductors, insulators and ferro-electric materials. Application of a dc electric field gives rise to a change in the diffracted intensity by several orders of magnitude and contrast on the topographs. The effect is illustrated with examples of -LiIO₃, KTiOPO₄, LiN₂H₅SO₄, KNbO₃, LiNH₄SO₄, quartz, silicon etc. and the mechanism for it is discussed.