Theoretical analysis and experimental application of CDS CMOS integrated circuit for uncooled infrared focal plane arrays

In this paper, a typical correlated double sampling (CDS) complementary metal oxide semiconductor (CMOS) circuit for uncooled infrared focal plane array (IRFPA) is theoretically analyzed, the key factor of CDS CMOS integrated circuit is pointed out, and a new CDS integrated circuit which is high correlative for low-frequency noise is applied in an experimental readout chip for uncooled IRFPA. Theoretical analysis indicates that the sample transfer function of a noise source acted on by CDS processing is related to noise frequency and sampling time interval and the key factor of CDS circuit for reducing or eliminating noise in readout integrated circuit is the sampling time interval. The experimental readout chip with high noise-correlative CDS integrated circuit is fabricated to verify the theoretical analysis, which can be applied to uncooled IRFPAs.