Evolution of the structural and optical properties of silver oxide films with different stoichiometries deposited by direct-current magnetron reactive sputtering |
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Authors: | Zhao Meng-Ke Liang Yan Gao Xiao-Yong Chen Chao Chen Xian-Mei Zhao Xian-Wei |
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Institution: | a. Key Laboratory of Material Physics (Ministry of Education), School of Physics and Engineering,Zhengzhou University, Zhengzhou 450052, China;b. College of Information Science and Engineering, Henan University of Technology, Zhengzhou 450001, China |
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Abstract: | Nitrogen doping of silver oxide (AgxO) film is necessary for its application in transparent conductive film and diodes because intrinsic AgxO film is a p-type semiconductor with poor conductivity. In this work, a series of AgxO films is deposited on glass substrates by direct-current magnetron reactive sputtering at different flow ratios (FRs) of nitrogen to O2. Evolutions of the structure, the reflectivity, and the transmissivity of the film are studied by X-ray diffractometry and sphectrophotometry, respectively. The specular transmissivity and the specular reflectivity of the film decreasing with FR increasing can be attributed to the evolution of the phase structure of the film. The nitrogen does not play the role of an acceptor dopant in the film deposition. |
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Keywords: | silver oxide film nitrogen doping optical properties magnetron reactive sputtering |
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