| X-射线荧光光谱法测定钛铁中的硅、锰、磷、铝 |
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| 引用本文： | 赵艳娟,刘喜秀,陶蕊. X-射线荧光光谱法测定钛铁中的硅、锰、磷、铝[J]. 化学分析计量, 2007, 16(4): 47-48 |
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| 作者姓名： | 赵艳娟 刘喜秀 陶蕊 |
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| 作者单位： | 石家庄钢铁有限公司品质管理部,石家庄,050031 |
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| 摘 要： | 介绍用X-射线荧光光谱仪测定钛铁中Si、Mn、P、Al含量的方法,通过试验确定了合适的研磨时间、压力和保压时间,用压片法制样,建立了各元素的工作曲线,各元素的测定范围分别为Si3.00%～6.00%,Mn1.00%～3.00%,P0.030%～0.070%,Al5.00%～9.00%。通过强度测量得到测定Si、Mn、P、Al的相对标准偏差分别为0.074%、0.308%、0.383%、0.040%,精密度满足测试要求。将该方法测定结果与化学法比对,准确度满足国家标准方法分析误差的要求。
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| 关 键 词： | X-射线荧光光谱仪 压片法 钛铁 硅 锰 磷 铝 |
| 收稿时间： | 2007-04-09 |
| 修稿时间： | 2007-04-09 |
DETERMINATION OF SILICON, MANGANESE, PHOSPHORUS AND ALUMINIUM IN Ti- Fe ALLOY BY X -RAY |
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| Zhao Yanjuan,Liu Xixiu,Tao Rui. DETERMINATION OF SILICON, MANGANESE, PHOSPHORUS AND ALUMINIUM IN Ti- Fe ALLOY BY X -RAY[J]. Chemical Analysis And Meterage, 2007, 16(4): 47-48 |
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| Authors: | Zhao Yanjuan Liu Xixiu Tao Rui |
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| Abstract: | A method for the determination of Si, Mn, P, A1 in Ti - Fe alloy by XRF was described. Sample facture were studied. Pulverization time ,pressure and pressure time were confirmed. The samples were pressed and the curve of elements were foun- ded by XRF. The linear range for the determination of elements were 3.00% - 6.00% for Si, 1.00% - 3.00% for Mn, 0. 030% - 0. 070% for P and 5.00% - 9.00% for A1. According to the determination of intension , RSDs of Si, Mn, P, AI were 0. 074%, O. 308% , O. 383% , O. 040% respectively. Results determined by the method were compared with those determined by chemical method. ,and accuracy of the method could completely meet the analysis error demand of the national standard method. |
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| Keywords: | X-ray fluorescent spectrometry pressing disc Ti-Fe alloy Si Mn P Al |
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