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X射线荧光光谱法测定硅石中主次量元素组分
引用本文:马景治,贾海峰,兰绿灯,王峰.X射线荧光光谱法测定硅石中主次量元素组分[J].中国无机分析化学,2017,7(2):55-58.
作者姓名:马景治  贾海峰  兰绿灯  王峰
作者单位:中南冶金地质研究所,湖北 宜昌,443003
摘    要:以Li_2B_4O_7、LiBO_2和LiF(质量比为45∶10∶5)为混合熔剂,NH_4NO_3为氧化剂,LiBr为脱模剂,熔融制作样片,采用硅质砂岩、石英岩标准样品和配制标准样品作为校准样品,建立了熔融制样-X射线荧光光谱法(XRF)测定硅石中主次量成分(SiO_2、Al_2O_3、TFe_2O_3、MgO、CaO、K_2O、MnO、TiO_2、P_2O_5)的快速分析方法。对样品制备以及分析测试过程中的条件进行了优化,在最优条件下,对标准样品(GBW03112、GBW07835)进行重复测定,相对标准偏差RSD2%。同时对3个混合配制的硅石标准样品进行分析,结果与参考值无显著性差异。

关 键 词:熔融制样  X射线荧光光谱法  硅石
收稿时间:2016/9/26 0:00:00
修稿时间:2016/12/21 0:00:00

Simultaneous Determination of Major and Minor Componentsin Silica Samples by XRF
MA Jingzhi,JIA Haifeng,LAN Lvdeng and WANG Feng.Simultaneous Determination of Major and Minor Componentsin Silica Samples by XRF[J].Chinese Journal of Inorganic Analytical Chemistry,2017,7(2):55-58.
Authors:MA Jingzhi  JIA Haifeng  LAN Lvdeng and WANG Feng
Institution:Central South Institute of Metallurgical Geology, Yichang,Hubei 443003,China,Central South Institute of Metallurgical Geology, Yichang,Hubei 443003,China,Central South Institute of Metallurgical Geology, Yichang,Hubei 443003,China and Central South Institute of Metallurgical Geology, Yichang,Hubei 443003,China
Abstract:A fast fused sample-XRF method for directly determining the major and minor components(SiO2,Al2O3,TFe2O3,MgO,CaO,K2O,MnO,TiO2 and P2O5)in silica samples was developed.Glass fuse pieces were made by fusion sample preparation method with Li2B4O7,LiBO2 and LiF (Mass ratio 45:10:5) as flux,NH4NO3 as oxidant and LiBr as stripping agent.Siliceous sandstone,quartzite standard samples and some self-made standard samples were all used as the calibration samples.Some conditions for sample preparation and analysis were optimized.Under optimal conditions,the certified reference material of GBW03112、GBW07835) were repeatedly tested.The relative standard deviation (RSD,n=12) was less than 2%.The proposed method was successfully applied to the determination of three mixed silica standard samples,and the results showed no significant difference with the reference values.
Keywords:fusion sample preparation  X-ray fluorescence spectrometer  silica sample
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