Adsorption of surfactants on low-charged layer silicates Part II: Adsorption of non-ionic surfactants |
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Authors: | W Röhl W von Rybinski M J Schwuger |
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Institution: | (1) Henkel KGaA, Düsseldorf, Germany;(2) Present address: Forschungszentrum Jülich Institut für Angewandte Physikalische Chemie, 52425, Germany |
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Abstract: | Nonionic surfactants were adsorbed on low-charged layer silicates in the interlayers. After drying, the surfactants were arranged in densely packed double layers. However, in suspension considerably higher basal spacings are measured by x-ray diffraction which indicate that large quantities of non-ionic surfactants are adsorbed. With the aid of calorimetry, enthalpies of displacement were recorded which suggest strong interactions of the non-ionic surfactants with smectites. In analogy to tests on hydrophilic SiO2, the adsorption of smectites is found to depend on the degree of ethoxylation of the non-ionic surfactant. The adsorption declines with increasing EO content.List of symbols
n
s
adsorbed amount of surfactants (mmol/g)
-
n
max
s
maximal adsorbed amount of surfactants
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d
L
basal spacing (nm)
- d
L
interlayer separation because of adsorption
-
V
M
molar volume of surfactant
-
V
max
s
volume of adsorbed surfactants (cm3/g)
- V
int
volume between the silicate layers (interlayer volume) (cm3/g)
- H
enthalpy of displacement (J/g)
- h
max
max. molar enthalpy of displacement (kJ/mol)
Part I: Prog. Colloid Polymer Sci. 84, 206This paper is part of W. Röhl's doctorial dissertation at the Heinrich-Heine University, Düsseldorf |
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Keywords: | Surfactants silicates adsorption calorimetry x-ray diffraction |
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