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Hydrogen profiling in thin films using coincident ERD
Authors:Lun-cun Wei  Yun-cheng Zhong  Jian-wei Han  Bin Liang  Xiao-tang Ren  Jin-xiang Yu  Ren-xing Li
Institution:(1) Institute of Heavy Ion Physics, Peking University, 100871 Beijing, China
Abstract:By using the coincident measurement, an ERD method has been established and used for hydrogen profiling in thin foils. In the present study, 6 MeV agr has been used as incident particle, the scattered agr and the recoiled proton from one collision were coincidentally detected at 150 (proton) and 173.9 (agr). This method has been used for hydrogen profiling of 5.6 mgrm Mylar and 8.6 mgrm aluminium foils. Because of the coincident measurement, the background is largely reduced, and its minimum detection limit is about 0.5% (atomic), lower than the conventional ERD method. The measured depth resolution in 5.6 mgrm Mylar is 0.6 mgrm. It is possible to use this method for hydrogen profiling in thin foils of several micron thickness.
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