Fourier optics approach to imaging with sub-wavelength resolution through metal-dielectric multilayers |
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Authors: | R Kotyński |
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Institution: | (1) Stanford University, Stanford, CA, USA;(2) Purdue University, West Lafayette, IN, USA; |
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Abstract: | Metal-dielectric layered stacks for imaging with sub-wavelength resolution are regarded as linear isoplanatic systems — a
concept popular in Fourier optics and in scalar diffraction theory. In this context, a layered flat lens is a one-dimensional
spatial filter characterised by the point spread function. However, depending on the model of the source, the definition of
the point spread function for multilayers with sub-wavelength resolution may be formulated in several ways. Here, a distinction
is made between a soft source and hard electric or magnetic sources. Each of these definitions leads to a different meaning
of perfect imaging. It is shown that some simple interpretations of the PSF, such as the relation of its width to the resolution
of the imaging system are ambiguous for the multilayers with sub-wavelenth resolution. These differences must be observed
in point spread function engineering of layered systems with sub-wavelength sized PSF. |
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Keywords: | |
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