Application of time and temperature resolved x-ray diffraction (TRXRD) to thermal analysis |
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Authors: | W. Engel N. Eisenreich M. Alonso V. Kolarik |
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Affiliation: | 1. Fraunhoferinstitut für Chemische Technologie, Joseph von Fraunhofer-Str. 7, D-7507, Berghausen, FRG
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Abstract: | The application of TRXRD for thermal analysis is demonstrated using examples of phase transitions, solid-state reactions and high-temperature corrosion. The measuring system produces a series of diffraction patterns, which are evaluated by a difference procedure that a reduces the data to curves comparable to DSC and TG curves and thus suited to kinetic evaluation. |
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