A test fixture for mapping thermal conduction in composites under transient and steady-state conditions |
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| Authors: | Carkhuff B. G. Roberts J. C. |
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| Affiliation: | Test Engineer, Applied Physics Laboratory, The Johns Hopkins University, Laurel, MD;Principal Engineer and Research Professor, Applied Physics Laboratory, The Johns Hopkins University, Laurel, MD |
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| Abstract: | A test fixture has been designed that allows the measurement of steady-state and transient temperature profiles in composites or other types of anisotropic or orthotropic materials under pure conduction in a vacuum. The uniqueness of this approach is the ability to study heat source to composite interface techniques by comparison of surface temperature contours and temperature versus time profiles. Localized changes in these conditions can be evaluated and the most successful technique can be adapted to larger parts, i.e., printed wiring boards (PWBs), electronic enclosure thermal walls, etc. |
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