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Sol-gel derived (LiCl)2-Al2O3-SiO2 thin film solid electrolyte |
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| Authors: | B. Wang M. Greenblatt J. Yan Y. Wu |
| Affiliation: | (1) Department of Chemistry, Rutgers, The State University of New Jersey, 08855-0939 Piscataway, New Jersey, USA;(2) Present address: Solid State Division, Oak Ridge National Laboratory, 37831-6030 Oak Ridge, TN |
| Abstract: | (LiCl)2-Al2O3-SiO2 thin film solid electrolyte was prepared by a sol-gel process with a spin coating technique. The thin film was studied by X-ray photoelectron spectroscopy (XPS) and ac impedance. The ionic conductivity of the solid electrolyte film is comparable to that of the bulk xerogel. The highest conductivity measured by ac impedance is 2.5×10–4 S·cm–1 at 300°C with Ea=0.75 eV. |
| Keywords: | solid electrolyte (thin film) alumino silicate ionic conductivity |
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