High-resolution XRD study of stress-modulated YBCO films with various thicknesses |
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| Authors: | Jie Xiong Wenfeng Qin Xumei Cui Bowan Tao Jinlong Tang Yanrong Li |
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| Affiliation: | aState Key Lab of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, PR China |
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| Abstract: | High-quality epitaxial YBa2Cu3O7−δ (YBCO) superconducting films with thicknesses between 0.2 and 2 μm were fabricated on (0 0 l) LaAlO3 with direct-current sputtering method. The influence of film thickness on the structure and texture was investigated by X-ray diffraction conventional θ–2θ scan and high-resolution reciprocal space mapping (HR-RSM). The films grew with strictly c-axis epitaxial, and no a-axis-oriented growth was observed up to a thickness of 2 μm. Lattice parameters of the YBCO films with different thicknesses were extracted from symmetry and asymmetry HR-RSMs. The X-ray lattice parameter method was used to determine the residual stress in YBCO films by measuring the a-, b-, c-axis strains, respectively. The results showed that YBCO films within thinner than 1 μm were under compressive stress, which was relieved increasing of film thickness. However, beyond 1 μm in thickness, YBCO films exhibited a tensile stress. Based on the experimental analysis, the variety of residual stresses in the films is mainly attributed to oxygen vacancies with thickness of YBCO film increasing. |
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| Keywords: | A1. High-resolution reciprocal space mapping A1. Oxygen vacancies A1. Residual stress B2. YBa2Cu3O7−δ (YBCO) superconducting film |
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