X-ray diffraction on solid solutions with atoms of different sizes |
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Authors: | Syneček V. Valvoda V. |
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Affiliation: | 1. Faculty of Mathematics and Physics, Charles University, Prague 2. Institute of Solid State Physics, Czechosl. Acad. Sci., Prague
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Abstract: | The formula for intensity of diffraction of X-rays on random binary solid solution is derived using the linear model of rigid atoms of different sizes in close-packed arrangement. The shape and position of the peaks of diffuse scattering resulting as the main diffraction effect are influenced by different sizes of atoms. On the other hand, the integrated intensity of the diffuse peaks is practically unaffected by the size effect. |
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