| Analysis of Electrical Properties of Post-Annealed Polycrystalline CaCu3Ti4O12 Films by Impedance Spectroscopy |
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| 作者姓名： | 方亮 沈明荣 李振亚 曹文开 |
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| 作者单位： | [1]Department of Physics and Jiangsu Key Laboratory of Thin Films, Suzhou University, Suzhou 215006 [2]Department of Mathematics and Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA |
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| 基金项目： | Supported by the National Natural Science Foundation of China Grant No 10204016. |
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| 摘 要： | Impedance spectroscopy is performed to establish the electrical property and microstructure relations of the asdeposited and post-annealed polycrystalline CaCu3Ti4O12 （CCTO） films. Our results show that the resistance and capacitance of the grains and grain boundaries could be tuned by changing the annealing atmosphere and temperature. The simple resistor-capacitor equivalent circuit and the modified constant phase element （CPE） circuit are used to describe the impedance spectroscopy, and excellent agreement between the calculated and measured curves is obtained in the CPE circuit. Based on the experimental results, it is suggested that the origin of the semiconductivity of the grains in CCTO polycrystalline films originates from their oxygen-loss, while the grain boundaries are close to oxygen- stoichiometry.
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| 关 键 词： | 电特性 多晶CaCu3Ti4O12薄膜 阻抗光谱学 薄膜物理学 |
| 收稿时间： | 2006-01-07 |
| 修稿时间： | 2006-01-07 |
Analysis of Electrical Properties of Post-Annealed Polycrystalline CaCu3Ti4O12 Films by Impedance Spectroscopy |
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| FANG Liang, SHEN Ming-Rong, LI Zhen-Ya, CAO Wen-Wu.Analysis of Electrical Properties of Post-Annealed Polycrystalline CaCu3Ti4O12 Films by Impedance Spectroscopy[J].Chinese Physics Letters,2006,23(4):990-993. |
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| Authors: | FANG Liang SHEN Ming-Rong LI Zhen-Ya CAO Wen-Wu |
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