Microstructural and optical properties of strain compensated InxGa1−xAs/InyAl1−yAs multiple quantum wells |
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Authors: | T.W. KimD.U. Lee D.C. Choo |
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Affiliation: | Department of Physics, Kwangwoon University, 447-1 Wolgye-dong, Nowon-ku, Seoul 139-701, South Korea |
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Abstract: | Transmission electron microscopy (TEM) and photocurrent (PC) measurements were carried out to investigate the microstructural and excitonic transitions in In0.52Ga0.48As/In0.55Al0.45As multiple quantum wells (MQWs). TEM images showed that high-quality 11-period strain-compensated In0.52Ga0.48As/In0.55Al0.45As MQWs had high-quality heterointerfaces. Based on the TEM results, a possible crystal structure for the In0.52Ga0.48As/In0.55Al0.45As MQWs is presented, and their strains are compensated. The results for the PC data at 300 K for several applied electric fields showed that several excitonic transitions shifted to longer wavelengths as the applied electric field increased. These results indicate that the strain-compensated In0.52Ga0.48As/In0.55Al0.45As MQWs hold promise for electroabsorption modulator devices. |
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Keywords: | A. Quantum wells B. Epitaxial growth D. Optical properties |
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