Split bregman method-based background extraction for blob-mura defect detection in thin film transistor-liquid crystal display image

In this paper, we present the results of using a split Bregman method for blob-Mura defect detection in a thin-film transistor-liquid crystal display (TFT-LCD) image. A reference image obtained by the split Bregman method was simply subtracted from a test image to detect blob-Mura defects. For a test image, two resulting images containing black or white bob-Mura defects were obtained separately. Through simulation it was verified that the proposed method has a superior capability for detecting blob-Mura defects.