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Quantitative electron probe microanalysis for the characterization of thin carbon-boron layers in fusion devices
Authors:Peter Karduck, Norbert Ammann, Hans Gü  nter Esser    rg Winter
Affiliation:(1) Gemeinschaftslabor für Elektronenmikroskopie der RWTH Aachen, Ahornstrasse 55, W-5100 Aachen, Federal Republic of Germany;(2) Institut für Plasmaphysik, Forschungszentrum Jülich GmbH, Ass. EURATOM/KFA, Postfach 1913, W-5170 Jülich, Federal Republic of Germany
Abstract:Summary The first wall of the fusion device TEXTOR at the Forschungszentrum Jülich has been coated in situ with an amorphous hydrogen rich carbon/boron film (a-C/B:H) which reduces plasma impurities caused by the plasma surface interaction. The results of the coating process of the 35 m2 large inner wall surface have been controlled by a recently developed modification of the quantitative electron probe microanalysis, which has been applied to 12 samples from specified positions inside the tokamak. The quantification itself is based on a Monte Carlo simulation of electron trajectories providing very accurate results for X-ray intensities emitted by elements present in the electron bombarded sample. The Monte Carlo results are used in the present work to calibrate the measured X-ray intensities emitted by boron and carbon from the a-C/B:H layers deposited on pure silicon substrates. As a result the total deposited mass of the layer per area unit as well as the composition of the layers (except hydrogen) could be determined very accurately. The relative errors were less than 7%. The limit of detectability were found to be in the range of one monolayer for boron as well as for carbon.
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