Scanning and friction-force microscopy of thin C60 films on GeS(001) |
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| Authors: | W Allers U D Schwarz G Gensterblum R Wiesendanger |
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| Institution: | (1) Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany;(2) Laboratoire Interdisciplinaire de Spectroscopie Electronique, Facultés Universitaires Notre-Dame de la Paix, 61, rue de Bruxelles, B-5000 Namur, Belgium |
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| Abstract: | The surface morphology of thin C60 films grown epitaxially under ultra-high vacuum conditions on layered GeS(001) substrates has been studied by scanning force microscopy. The individual C60 layers were imaged down to molecular resolution. The growth mechanism was found to be of layer-by-layer type at the initial stages of growth, but seems to be very sensitive to the substrate temperature. The tribological properties of these films have been probed simultaneously by means of lateral force microscopy. The frictional coefficient of the C60 layers was determined to be significantly smaller than the frictional coefficient of the GeS substrate. This demonstrates that well-ordered C60 films can have even better lubricating properties than a layered material. |
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| Keywords: | 68 55 |
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