首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Calculation of temperature fields with a film-substrate interfacial layer model to discuss the layer-pair number effects on the damage thresholds of LaF3/MgF2 high reflectors at 355 nm
Authors:Guanghui Liu  Ming Zhou  Guohang Hu  Xiaofeng Liu  Yunxia Jin  Hongbo He  Zhengxiu Fan
Institution:Key Laboratory of Materials for High Power Lasers, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 390 Qinghe Road, Jiading District, Shanghai 201800, PR China
Abstract:Laser induced damage thresholds (LIDT) of LaF3/MgF2 high reflectors at 355 nm were measured and investigated as a function of layer-pair number. Generally, LaF3/MgF2 coatings with more layer pairs possessed higher LIDT, but coatings with too high layer-pair number crazed because of high tensile stress, so the LIDT of them decreased badly. The temperature rise in the coatings was calculated based on a film-substrate interfacial absorption model, and the depth of the damage in the coatings were measured by a Veeco optical profilograph. The two characterization methods together were used to interpret the effects of layer-pair number on LIDT, and the damage mechanism of coatings at laser wavelength of 355 nm was also discussed.
Keywords:LaF3/MgF2 high reflectors  Temperature fields  Film-substrate interface  LIDT  Layer-pair number  Damage depth  Damage mechanism
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号