Optical and structural studies on Ba(Mg1/3Ta2/3)O3 thin films obtained by radiofrequency assisted pulsed plasma deposition |
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Authors: | ND Scarisoreanu L Nedelcu MI Toacsan SD Stoica |
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Institution: | a National Institute for Laser, Plasma and Radiation Physics, RO-077125, M?gurele-Bucharest, Romania b National Institute of Materials Physics, RO-077125, M?gurele-Bucharest, Romania c University of Craiova, Faculty of Physics, RO-200585, Craiova, Romania |
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Abstract: | Single-phase Ba(Mg1/3Ta2/3)O3 thin films were prepared by radiofrequency plasma beam assisted pulsed laser deposition (RF-PLD) starting from a bulk ceramic target synthesized by solid state reaction. Atomic force microscopy, X-ray diffraction and spectroscopic ellipsometry were used for morphological, structural and optical characterization of the BMT thin films. The X-ray diffraction spectra show that the films exhibit a polycrystalline cubic structure. From spectroscopic ellipsometry analysis, the refractive index varies with the thin films deposition parameters. By using the transmission spectra and assuming a direct band to band transition a band gap value of ≈4.72 eV has been obtained. |
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Keywords: | 81 15 Fg 77 55 &minus g 78 66 &minus w |
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