Controlling Single-Photon Emission with Ultrathin Transdimensional Plasmonic Films

The properties of a two-level quantum dipole emitter near an ultrathin transdimensional plasmonic film are studied theoretically. The model system studied mimics a solid-state single-photon source device. Using realistic experimental parameters, the spontaneous and stimulated emission intensity profiles are computed as functions of the excitation frequency and film thickness, followed by the analysis of the second-order photon correlations to explore the photon antibunching effect. It is shown that ultrathin transdimensional plasmonic films can greatly improve photon antibunching with thickness reduction, which allows one to control the quantum properties of light and make them more pronounced. Knowledge of these features is advantageous for solid-state single-photon source device engineering and overall for the development of the new integrated quantum photonics material platform based on the transdimensional plasmonic films.