| Abstract: | An etching technique was developed to investigate dislocations in β-copper phthalocyanine single crystals. Considering the expected content of dislocations and the etch pit symmetry the symmetric etch pits are correlated to 010]-edge dislocations on {201 }- and {001}-lattice planes with (001)- and (201 )-slip planes. Asymmetric etch pits on {001}- and {201 }-planes are connected with 010]-edge dislocations related to (100)- and (101 )-slip planes. The dislocation density on growth planes and cleavage planes is commonly lower than 100 cm−2. 010]-screw dislocations are not observed, but their existence could not be excluded. |
