Determination of transition probability for the 655-nm Tl line |
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| Institution: | 1. Department of Computer Science, Khwaja Fareed University of Engineering and Information Technology, Rahim Yar Khan, Pakistan;2. Department of Computer Science & Information Technology, The Islamia University of Bahawalpur, Bahawalpur, 63100, Pakistan;3. Department of Computer Science, University of Salerno, Via Giovanni Paolo II, 132, Fisciano 84084, Salerno, Italy |
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| Abstract: | Studies of high-presure Hg-TlI a.c. (50 Hz) arc plasmas have been used to verify the validity of Boltzmann statistics at the moment of maximum electron density (5 ms) by applying LTE criteria. For a known plasma temperature, the transition probability of the optically-thin 655-nm line of Tl was derived from emission measurements by using the self-reversed 535-nm line of Tl as reference A655 = (3.74±0.37) × 106 s-1]. |
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